And Testable Design Solution 'link' - Digital Systems Testing

To combat these challenges, engineers integrate test-specific hardware into the design itself. The most prevalent solutions include:

The difficulty of measuring and verifying the logic value of internal nodes from the external output pins. digital systems testing and testable design solution

A shift-register cell (boundary scan cell) is placed between each functional pin of an IC and its internal core logic. These cells are connected into a serial chain around the periphery of the chip. To combat these challenges